Cross-fringe versus single-fringe probabilities

High-resolution TEM is well-suited to characterizing nanocrystals, where lattice fringes serve as a source of structural information [1, 2]. For example, 3D lattice parameters can be measured from 2D lattice fringe images taken at as few as two different specimen orientations [3-6]. Recent work has shown that lattice fringe-visibility maps, a thin-specimen extension of bend-contour and channeling-pattern maps, can assist crystallographic study in direct space much as do Kikuchi maps in reciprocal space [7]. For example with lattice resolution and a sufficiently precise multi-axis goniometer, a nanocrystal can be tilted while the condition for visualizing a set of lattice fringes is maintained so as to "acquire" new lattice fringe normals (co-vectors) and thus continually refine a basis triplet containing information on both the nanocrystal's lattice and its orientation. Local specimen thickness measurements are another promising possibility.